ETS 2007 - Call for Papers

CALL FOR PAPERS

Overview -- Publications -- Submissions -- Key Dates -- Further Information -- Committees

Overview

The IEEE European Test Symposium (ETS) is Europe's premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics, and new trends in the area of electronic-based circuit and system testing. In 2007, ETS will take place in Freiburg, Southern Germany's Black Forest area. ETS'07 is being organized by the Albert-Ludwigs-University of Freiburg, which celebrates its 550-year anniversary in 2007, and is sponsored by the Test Technology Technical Council (TTTC) of the IEEE Computer Society.

You are invited to participate and submit your contributions to ETS'07. The areas of interest of ETS'07 include (but are not limited to) the following topics:

Analog, Mixed-Signal, RF Test
ATE Hardware and Software
Automatic Test Generation
Board and System Test
Built-In Self Test (BIST)
Current-Based Test
Defect and Fault Tolerance
Delay and Performance Test
Design for Test(ability) (DfT)
Design Verification and Validation
Diagnosis and Debug
(Embedded) System Test
Failure Analysis
Fault Modeling and Simulation
High-Level DfT and TPG
High-Speed IO/Interconnect Test
Memory Test and Repair
MEMS and Nanotechnology Test
Microprocessor Test
Nanometer Technologies Test
On-LineTest
Power Issues in Test
Self-Repair Methodologies
Signal Integrity Test
Standards in Testing
System-in-Package (SiP) Test
System-on-Chip (SoC) Test
Test Data Compression
Test of Reconfigurable Systems
Test Quality and Reliability
Test(ability) Synthesis
Thermal Test
Yield Analysis and Enhancement

Publications

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ETS'07 will produce Formal Proceedings of selected papers, published by the IEEE Computer Society, and an Informal Digest. A post-conference CD-ROM with papers, presentation slides, and photos will be mailed to all participants. The best contributions will be selected for submission to regular issues of the "Journal of Electronic Testing: Theory and Applications" (JETTA), published by Kluwer Academic Publishers. ETS'07 will present a Best Paper Award at ETS'08.

Submissions

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ETS'07 seeks original, unpublished contributions of the following types.

Scientific papers for the Formal Proceedings.
Workshop-type papers for the Informal Digest, including "emerging ideas" and "case studies".
Proposals for panels, embedded tutorials, and other special sessions.
"Vendor Session" presentations, for which corresponding white papers can be included in the Informal Digest.

Detailed submission instructions, including selection criteria and publication policies, for the various types of contributions are posted on the ETS'07 web page. TTTC Test Technology Educational Program (TTEP) tutorials on emerging test technology topics will be offered during ETS 2007. Tutorial proposals should be submitted according to TTEP 2007 submission deadlines.

Key Dates

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Submission deadline: December 8, 2006
Notification of acceptance: February 14, 2007
Camera-ready manuscript: March 11, 2007

Further Information

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Visit the ETS web page at: http://www.ieee-ets.org

Bernd Becker - General Chair
Institute for Computer Science
Albert-Ludwigs-University of Freiburg
Georges-Köhler-Allee 51
D-79110 Freiburg, Germany
Tel.: +49-761-203-8140
Fax: +49-761-203-8142
Email: ets07@informatik.uni-freiburg.de

Zebo Peng - Program Chair
Dept. of Computer and Information Science
Linköping University
SE-581 83 Linköping, Sweden
Tel.: +46-13-282067
Fax: +46-13-284499
E-mail: zpe@ida.liu.se

Committees

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Organization Committee

General Chair
B. Becker - U. Freiburg (D)

General Vice Chair
M. Sonza Reorda - Polit. di Torino (I)

Finance Chair
I. Polian

Local Arrangements
P. Engelke

Registration
M. Herbstritt

Web
S. Spinner

Accommodation
A. Flashar

Program Committee

Program Chair
Z. Peng - Linköping U. (S)

Program Vice Chair
H.-J. Wunderlich - U. Stuttgart (D)

Industrial Relations Chair
P. Muhmenthaler - Infineon (D)

Publications Chair
C. Landrault - LIRMM (F)

Panel Chair
P. Prinetto - Politecnico di Torino (I)

Tutorial Chair
J. Figueras - UPC Barcelona (E)

Imbedded Tutorial Chair
P. Girard - LIRMM (F)

Regional Liaisons
L. Carro - UFRGS (BR)
A. Singh - Auburn U. (USA)
A. Osseiran - Edith Cowan U. (AUS)
C.-W. Wu - Nat. Tsing-Hua U. (TW)

Topic Chairs
B. Al-Hashimi - U. Southampton (UK)
S. Hellebrand - U. Paderborn (D)
H. Kerkhoff - U. Twente (NL)
E. Larsson - Linköping U. (S)
E.J. Marinissen - NXP Research (NL)
C. Metra - U. Bologna (I)
M. Renovell - LIRMM (F)
J. Tyszer - Poznan Tech. U. (PL)

Members
E.J. Aas - Norw. U. of Science (N)
M. Abadir - Motorola (USA)
R. Aitken - ARM Artisan (USA)
W. Anheier - U. Bremen (D)
F. Azais - LIRMM (F)
L. Balado - U. Polit. de Catalunya (E)
A. Benso - Polit. di Torino (I)
G. Carlsson - Ericsson (S)
K. Chakrabarty - Duke U. (USA)
W. Daehn - HS Magdbg.-Stendal (D)
R. Dorsch - IBM Entw. (D)
M.-L. Flottes - LIRMM (F)
G. Francis - Philips Semiconductors (UK)
H. Fujiwara - NAIST (J)
F. Fummi - U. Verona (I)
D. Gizopoulos - U. Piraeus (GR)
E. Gramatova - Slov. Acad. Sci. (SK)
S. Hamdioui, Delft U. of Tech. (NL)
C. Hill - Mentor Graphics (UK)
M. Hirech - Synopsys (USA)
A. Hlawiczka - Silesian TU. (PL)
M. S. Hsiao - Virginia T. U. (USA)
P. Hughes - ARM (UK)
A. Ivanov - U. British Col. (CAN)
R. Kapur - Synopsys (USA)
S. Kajihara - Kyushu Inst. Tech. (J)
B. Kruseman - Philips Research (NL)
S. Kundu - U. of Massachusetts (USA)
H. Lang - Freescale Semi. (D)
M. Lubaszewski - UFRGS (BR)
Y. Makris - Yale U. (USA)
H. Manhaeve - QStar Test (B)
T. Margaria - U. Göttingen (D)
P. Maxwell - Agilent Tech. (USA)
L. Miclea - U. Cluj-Napoca (RO)
S. Mir - TIMA CMP (F)
Y. Miura - Tokyo Metro. U. (J)
W. Moore - Oxford U. (UK)
N. Nicolici - McMaster U. (CAN)
F. Novak - Jozef Stephan Inst. (SLO)
O. Novak - TU Liberec (CZ)
A. Orailoglu - UCSD (USA)
S. Ozev - Duke U. (USA)
A. Paschalis - U. Athens (GR)
A. Pataricza - Budapest U. TE (H)
F. Poehl - Infineon Techn. (D)
J. Raik - Tallinn U. (EE)
J. Rajski - Mentor Graphics (USA)
A. Richardson, U. Lancaster (UK)
J. Rivoir - Agilent Techn. (D)
C. Robach - ESISAR (F)
P. Rosinger - U. Southampton (UK)
B. Rouzeyre - LIRMM (F)
A. Rueda - CNM (E)
G. Russell - Newcastle U. (UK)
P. Sanchez - U. Cantabria (E)
J. Segura - U. Illes Balears (E)
B. Straube - EAS/IIS FhG (D)
J.-P. Teixeira - IST/INESC (P)
N. Touba - U. of Texas (USA)
R. Ubar - Tallinn U. (EE)
B. Vermeulen - Philips Research (NL)
C. Wegener - U. College Cork (IRL)
M. Zwolinski - U. Southampton (UK)

Steering Committee

Chair
Chair: C. Landrault - LIRMM (F)

Members
B. Al-Hashimi - U. Southampton (UK)
B. Becker - U. Freiburg (D)
J. Figueras - UPC Barcelona (E)
E.J. Marinissen - NXP Research (NL)
P. Muhmenthaler - Infineon (D)
Z. Peng - Linköping U. (S)
P. Prinetto - Politecnico di Torino (I)
M. Renovell - LIRMM (F)
M. Sonza-Reorda - Polit. di Torino (I)
J.-P. Teixeira - IST/INESC (P)
H.-J. Wunderlich - U. Stuttgart (D)
Y. Zorian - Virage Logic (USA)

For more information, visit us on the web at: http://www.ieee-ets.org/

The 12th IEEE European Test Symposium (ETS'07) is organized by the Albert-Ludwigs-University of Freiburg and sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

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	12th IEEE European Test Symposium (ETS'07) May 20-24, 2007 Convention Center, Freiburg, Germany http://www.ieee-ets.org/